Optics: measuring and testing – Material strain analysis – With polarized light
Reexamination Certificate
2007-08-31
2010-12-28
Toatley, Gregory J (Department: 2877)
Optics: measuring and testing
Material strain analysis
With polarized light
Reexamination Certificate
active
07859653
ABSTRACT:
A method, computer program product and system for analyzing multispectral images from a plurality of regions of birefringent material, such as a polymer film, using polarized light and a corresponding polar analyzer to identify differential strain in the birefringent material. For example, the birefringement material may be low-density polyethylene (LDPE), high-density polyethylene (HDPE), polypropylene, polyethylene terephthalate (PET), polyvinyl chloride (PVC), polyvinylidene chloride, polyester, nylon, or cellophane film. Optionally, the method includes generating a real-time quantitative strain map.
REFERENCES:
patent: 4425808 (1984-01-01), Rand
patent: 4498231 (1985-02-01), Rand
patent: 4668086 (1987-05-01), Redner
patent: 4877205 (1989-10-01), Rand
patent: 5104059 (1992-04-01), Rand et al.
patent: 6160618 (2000-12-01), Garner
patent: 6490043 (2002-12-01), Kebabian
patent: 6657758 (2003-12-01), Garner
patent: 6762713 (2004-07-01), McMillan et al.
patent: 6813018 (2004-11-01), Richman
patent: 6867863 (2005-03-01), Kadlec
patent: 6906800 (2005-06-01), Serna, Jr.
patent: 6943869 (2005-09-01), Hubner et al.
patent: 7310145 (2007-12-01), Abuzaina et al.
patent: 2003/0020911 (2003-01-01), Wang et al.
patent: 2006/0007424 (2006-01-01), Hubner et al.
Cisar Alan J.
Garner Harold R.
Huebschman Michael L.
Ragucci Anthony J.
Lynntech Inc.
Streets Jeffrey L.
Streets & Steele
Toatley Gregory J
Valentin Juan D
LandOfFree
Detecting strain in birefringent materials using spectral... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Detecting strain in birefringent materials using spectral..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Detecting strain in birefringent materials using spectral... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4220566