Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2007-04-17
2007-04-17
Wu, Jingge (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S190000, C382S284000, C345S426000
Reexamination Certificate
active
10391999
ABSTRACT:
A method detects silhouette edges in images. An ambient image is acquired of a scene with ambient light. A set of illuminated images is also acquired of the scene. Each illuminated image is acquired with a different light source illuminating the scene. The ambient image is combined with the set of illuminated to detect cast shadows, and silhouette edge pixels are located from the cast shadows.
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Raskar Ramesh
Yu Jingyi
Brinkman Dirk
Hung Yubin
Mitsubishi Electric Research Laboratories Inc.
Mueller Clifton O.
Vinokur Gene V.
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