Detecting interferential diffraction of a reflected beam from a

Details Detecting interferential diffraction of a reflected beam from a Detecting interferential diffraction of a reflected beam from a

1992-06-03

1994-08-16

Dzierzynski, Paul M.

Dynamic information storage or retrieval

Storage medium structure

Optical track structure

369100, 369109, 369288, G11B 700

Patent

active

053393066

ABSTRACT:
A memory medium includes a memory layer of a polymer liquid crystal and a reflection layer disposed on a substrate. A record part having a different refractive index from that of a non-record part is formed in the memory layer so that the record part and the non-record part have a difference in optical thickness of the memory layer. In a reproduction step, the memory medium is irradiated with a reproduction beam of coherent light so that the reproduction beam is transmitted through the memory layer, reflected at the reflection layer and re-transmitted through the memory layer, during which the reproduction beam is subjected to interferential diffraction due to the optical thickness difference between the record part and the non-record part to allow readout of the recorded data.

REFERENCES:
patent: 4115809 (1978-09-01), Ueno
patent: 4305081 (1981-12-01), Spong
patent: 4329697 (1982-05-01), Bell
patent: 4398203 (1983-08-01), Cornet
patent: 4933243 (1990-06-01), Hara et al.
patent: 4965591 (1990-10-01), Kurabayashi et al.
patent: 5019476 (1991-05-01), Kanno et al.
patent: 5124183 (1992-06-01), Nakano et al.
patent: 5141785 (1992-08-01), Yoshinada et al.

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