Thermal measuring and testing – Thermal testing of a nonthermal quantity – Of susceptibility to thermally induced deteriouration – flaw,...
Reexamination Certificate
2005-03-15
2005-03-15
Fulton, Christopher W. (Department: 2859)
Thermal measuring and testing
Thermal testing of a nonthermal quantity
Of susceptibility to thermally induced deteriouration, flaw,...
C374S007000
Reexamination Certificate
active
06866416
ABSTRACT:
A method and semiconductor device for detecting a heat generating failure in an unpassivated semiconductor device. The semiconductor device has an unpassivated surface and a heat generating failure, e.g., short circuit. A coating may be applied to the unpassivated surface of the semiconductor device. The coating may be non-electrically conducting and capable of localizing heat generated by the failure in a particular area. The semiconductor device may be biased. The failure may then be detected by detecting a location of the heat generated by the failure in the coating.
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Ang Boon-Yong
Choi Alice H.
Mahanpour Mehrdad
Massoodi Mohammad
Advanced Micro Devices , Inc.
Fulton Christopher W.
Gonzalez Madeline
Voigt, Jr. Robert A
Winstead Sechrest & Minick P.C.
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