Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Event-driven
Reexamination Certificate
2005-07-19
2005-07-19
Picard, Leo (Department: 2125)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Event-driven
C703S013000, C703S014000, C703S016000
Reexamination Certificate
active
06920418
ABSTRACT:
A system, method, and data structure for providing an efficient means for monitoring model events. The present invention generates detection events that are accessible by the RTX. Such detection events are generated by instrumentation entities. Detection events are implemented as output ports on an instrumentation entity. Furthermore, the present invention discloses an enhanced API function for directly accessing detection events within a given simulation model.
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Roesner Wolfgang
Williams Derek Edward
Dillon & Yudell LLP
International Business Machines - Corporation
McBurney Mark E.
Picard Leo
Rodriguez Carlos Ortiz
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