Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-11-13
2010-11-23
He, Amy (Department: 2831)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090
Reexamination Certificate
active
07839150
ABSTRACT:
A detecting device for detecting the electrical connection between several first pads and second pads of a package substrate is provided. The first and the second pads are disposed on two opposite sides of the package substrate. The detecting device includes a socket unit, several first detecting components and several second detecting components. The socket unit is disposed on and coupled to the first pads. The first detecting components are disposed on and coupled to the socket unit. The second detecting components are disposed under and coupled to the second pads. The socket unit and the second detecting components are disposed on two opposite sides of the package substrate. While detecting, the first detecting components, the socket unit, the first pads, the second pads and the second detecting components are electrically connected sequentially, so as to determine whether the first pads are respectively and electrically connected to the second pads.
REFERENCES:
patent: 5909124 (1999-06-01), Madine et al.
patent: 6492825 (2002-12-01), Choi
patent: 6774662 (2004-08-01), Co et al.
Cheng Feng-Chen
Huang Wen-Shian
Lee Chang-Shuo
Su Heng-Lung
Tseng Sheng-Feng
Advanced Semiconductor Engineering Inc.
Bacon & Thomas PLLC
He Amy
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