Data processing: measuring – calibrating – or testing – Calibration or correction system
Reexamination Certificate
2008-09-02
2008-09-02
Cosimano, Edward R (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
C318S628000, C318S638000, C318S650000, C369S043000, C369S044250, C369S044320, C369S044350, C369S044360, C700S028000, C700S029000, C700S031000, C702S094000, C702S150000
Reexamination Certificate
active
11446730
ABSTRACT:
A Bemf detect circuit is configured for modeling Bemf error via calculation of time correlations associated with two or more different non-calibrated sense resistor gain values to derive a calibrated sense resistor gain value. A method is provided for calibrating a Bemf detector circuit by setting a sense resistor gain to a plurality of different gain values, observing Bemf sample values for each of the gain values, and deriving a calibrated gain value by non-iteratively modeling the relationship between the gain values and the associated Bemf sample values.
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Harmer Brent Jay
Koay KarWei
Cosimano Edward R
Fellers , Snider, et al.
Seagate Technology LLC
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