Detecting a defective area of an inspected apparatus

Details Detecting a defective area of an inspected apparatus Detecting a defective area of an inspected apparatus

2007-05-22

2007-05-22

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

C702S083000, C702S120000, C702S117000, C714S724000

Reexamination Certificate

active

11002589

ABSTRACT:
Detecting a defect of an inspected apparatus having a plurality of functional blocks. A plurality of test data elements are generated according to each of the plurality of functional blocks. Test data including one or more of such test data elements stored in one or more test data areas is prepared. Based on the test data, reference data and processed data are generated. By comparing the processed data with the reference data, the defect of the inspected apparatus is detected.

REFERENCES:
patent: 5617429 (1997-04-01), Goto
patent: 5745501 (1998-04-01), Garner et al.
patent: 5894528 (1999-04-01), Yasumi et al.
patent: 5930271 (1999-07-01), Takahashi
patent: 6553530 (2003-04-01), Kim
patent: 6708301 (2004-03-01), Ohta et al.
patent: 7062696 (2006-06-01), Barry et al.
patent: 2005/0071102 (2005-03-01), Shimizu
patent: 2006/0059387 (2006-03-01), Swoboda et al.
patent: 3-297262 (1991-12-01), None
patent: 9-102839 (1997-04-01), None

Affiliated with

Also associated with

Rating

Detecting a defective area of an inspected apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Detecting a defective area of an inspected apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Detecting a defective area of an inspected apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3778996