Active solid-state devices (e.g. – transistors – solid-state diode – With shielding
Reexamination Certificate
2006-10-10
2006-10-10
Huynh, Andy (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
With shielding
C257S421000, C257S660000, C257S295000, C438S003000, C438S005000
Reexamination Certificate
active
07119419
ABSTRACT:
A memory device is proposed which enables to guarantee the operation of MRAM elements being magnetically shielded against a large external magnetic fields without being affected by an internal leakage magnetic field. The MRAM elements30which are shielded by magnetic shield layers33, 34are placed at an intermediate region41avoiding an edge region43and a center region42of the magnetic shield layers33, 34so that the MRAM element is secured to operate normally without being affected by the internal leakage magnetic field avoiding the edge region43where the magnetic shield effect is reduced by the exterior magnetic field, and avoiding the central region42where the internal leakage magnetic field is large.
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Ikarashi Minoru
Kato Yoshihiro
Kobayashi Kaoru
Okayama Katsumi
Yamamoto Tetsuya
Huynh Andy
Nguyen Tram H.
Sonnenschein Nath & Rosenthal LLP
Sony Corporation
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