Measuring and testing – Probe or probe mounting
Reexamination Certificate
2008-04-14
2010-10-26
Williams, Hezron (Department: 2856)
Measuring and testing
Probe or probe mounting
C439S348000
Reexamination Certificate
active
07819035
ABSTRACT:
A connector system for attaching a probe to a probe shaft mating assembly comprising: a probe shaft mating assembly comprising a connector body, a plunger chamber located within the connector body, a spring located within the plunger chamber, a locking ball channel extending through the connector body from the plunger chamber to the outer surface of the connector body, a locking ball located within the locking ball channel, and a plunger located within the plunger chamber adjacent to the spring, wherein the locking ball is in contact with the outer surface of the plunger; a probe comprising a probe body, a probe shaft chamber located within the probe shaft facing end of the probe body, and a locking ball receiver located in the probe body adjacent to the probe shaft chamber; wherein the diameter of the probe shaft chamber is larger than that of the probe shaft mating assembly such that when the plunger and the spring are moved from a first position to a second position, the locking ball moves inwardly towards the plunger chamber and below the outer surface of the connector body allowing the probe facing end of the probe shaft mating assembly to enter the probe shaft chamber, and when the plunger and spring are moved from the second position to the first position, the locking ball moves towards the surface of the connector body, extending beyond the outer surface of the connector body such that the locking ball engages the locking ball receiver and fixes the probe to the probe shaft mating assembly.
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patent: 4846714 (1989-07-01), Welsby et al.
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patent: 6805572 (2004-10-01), Lai
patent: 7001199 (2006-02-01), Badalpour
patent: 2004/0126182 (2004-07-01), Lin
PCT Search Report issued in connection with corresponding WO Patent Application No. US09/37546 filed on Mar. 3, 2009.
Draper Jeffrey
Wolf Matthew
Conklin Mark A.
GE Inspection Technologies LP
Global Patent Operation
Kolb Nathaniel
Williams Hezron
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