Deskewing time-critical signals in automatic test equipment

Details Deskewing time-critical signals in automatic test equipment Deskewing time-critical signals in automatic test equipment

1982-05-24

1985-04-16

Heyman, John S.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

328163, 328 58, 307265, 307268, H03K 506

Patent

active

045118469

ABSTRACT:
Apparatus is provided for supplying deskewed signals. The apparatus includes a timing generator (20) for generating a pulse of desired duration, a deskew unit (17) connected to receive a pulse and adjust its width to compensate for previous errors, a differentiation network (15) for dividing the pulse into a leading and trailing edge signal, a plurality of logic gates (80 through 85) for receiving the pair of signals and supplying one of the pair along a set path and the other of the pair along a reset path, a deskew unit (86 and 89) associated with each path for delaying the signals thereon, and a latch (53) coupled to the deskew units to reform the electrical signal. Logic gates (80 through 85) operate under control of a format selector (90).

REFERENCES:
patent: 3514706 (1970-05-01), Dupraz et al.
patent: 3727144 (1973-04-01), Senoo
patent: 4075569 (1978-02-01), Wright
patent: 4141033 (1979-02-01), de Boer
patent: 4280224 (1981-07-01), Chethik

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