Measuring and testing – Moisture content or absorption characteristic of material
Reexamination Certificate
2007-10-29
2009-08-11
Williams, Hezron (Department: 2856)
Measuring and testing
Moisture content or absorption characteristic of material
Reexamination Certificate
active
07571637
ABSTRACT:
A design structure for an on-chip real-time moisture detection circuitry for monitoring ingress of moisture into an integrated circuit chip during the operational lifetime of the chip. The moisture detection circuitry includes one or more moisture-sensing units and a common moisture monitor for monitoring the state of each moisture-sensing units. The moisture monitor can be configured to provided a real-time moisture-detected signal for signaling that moisture ingress into the integrated circuit chip has occurred.
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Chen Fen
Feng Kai D.
Downs Rachlin & Martin PLLC
Gissel Gunnar J
International Business Machines - Corporation
Williams Hezron
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