Radiant energy – Invisible radiant energy responsive electric signalling – Semiconductor system
Reexamination Certificate
2011-01-25
2011-01-25
Porta, David P (Department: 2884)
Radiant energy
Invisible radiant energy responsive electric signalling
Semiconductor system
Reexamination Certificate
active
07875854
ABSTRACT:
The invention relates to a design structure, and more particularly, to a design structure for an alpha particle sensor in SOI technology and a circuit thereof. The structure is a silicon-on-insulator radiation detector which includes: a charge collection node; a precharge transistor that has a source from the charge collection node, a drain at Vdd, and a gate controlled by a precharge signal; an access transistor that has a source from the charge collection node, a drain connecting to a readout node, and a gate controlled by a read-out signal; and a detector pulldown transistor having a drain from the charge collection node, a source to ground, and a grounded gate.
REFERENCES:
patent: 4413327 (1983-11-01), Sabo et al.
patent: 4464752 (1984-08-01), Schroeder et al.
patent: 4931990 (1990-06-01), Perkin
patent: 5022027 (1991-06-01), Rosario
patent: 5331164 (1994-07-01), Buehler et al.
patent: 5604755 (1997-02-01), Bertin et al.
patent: 5705807 (1998-01-01), Throngnumchai et al.
patent: 6275747 (2001-08-01), Wada et al.
patent: 6828561 (2004-12-01), Layman et al.
patent: 6986078 (2006-01-01), Rodbell et al.
patent: 6995376 (2006-02-01), Cottrell et al.
patent: 7057180 (2006-06-01), Fifield et al.
patent: 7166847 (2007-01-01), Hannah
patent: 7271389 (2007-09-01), August et al.
patent: 7375339 (2008-05-01), Abadeer et al.
patent: 7383475 (2008-06-01), Corbin
patent: 2001/0022521 (2001-09-01), Sasaki et al.
patent: 2005/0003612 (2005-01-01), Hackler et al.
patent: 2006/0010346 (2006-01-01), Minemier
patent: 2007/0252088 (2007-11-01), Abadeer et al.
patent: 2007/0283193 (2007-12-01), Lewis et al.
patent: 2008/0128629 (2008-06-01), Abadeer et al.
Anathan et al., “Process to Fabricate a Bipolar IC with Reduced Alpha Particle Damage” IBM TDB 05-80, p. 5365-5366, May 1,1980.
Coufal et al., “Ferroelectric Detector for Real Time Recording of the Trajectory of Photon, Electron and Other Particle Beams”, TBD 09-93, V.36, n9B, p. 431-432, Sep. 1983.
Ziegler, “Orientation of Planar Circuits to Minimize Cosmic Ray Soft-Fails”, IBM TBD 07-87, p. 503, Jul. 1, 1987.
U.S. Appl. No. 12/099,304 entitled “Method for Detecting Alpha Particles in SOI Technology”, Filed Apr. 8, 2008, First named inventor: Ethan H. Cannon.
Office Action dated Oct. 10, 2008 for related U.S. Appl. No. 12/099,304.
Cannon Ethan H.
Hauser Michael J.
Sullivan Timothy D.
Boosalis Faye
International Business Machines - Corporation
Kotulak Richard
Porta David P
Roberts Mlotkowski Safran & Cole P.C.
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