Image analysis – Histogram processing – For setting a threshold
Patent
1982-01-19
1984-04-03
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
364490, 364560, 382 25, 382 27, 382 41, 382 49, G06K 936
Patent
active
044412070
ABSTRACT:
A pipeline of programmable serial neighborhood stages is used to automatically check for adherence to a set of predetermined geometrical constraints or design rules used in the fabrication of electronic components such as integrated circuit devices. In a disclosed embodiment, bit-map representations of several IC masks are superimposed in one composite image matrix for processing in the pipeline. Advantages in processing speed, especially for design rule checking requiring data from more than one mask, are obtained since all necessary data is available to the stages in the pipeline.
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patent: 4300122 (1981-11-01), McMahon
patent: 4301443 (1981-11-01), Sternberg et al.
patent: 4345312 (1982-08-01), Yasuye et al.
Baker et al., "Tools for Verifying Integrated Circuit Designs," Lamda, Fourth Quarter, 1980.
Baker, "Artwork Analysis Tools for ULSI Circuits," (M.S. Thesis) MIT, 1980.
Seiler, "Special Purpose Hardware for Design Rule Checking," Private Communication, in Preparation for Second Caltech Conference on Very Large Scale Integration, Jan. 10-21, 1981.
Baird, "Fast Algorithms for LSI Artwork Analysis," Journal of Design Automation and Fault Tolerant Computing, vol. 2, No. 2, May 1978.
Lougheed Robert M.
Mudge Trevor N.
Boudreau Leo H.
Environmental research Institute of Michigan
Regents of the University of Michigan
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