Design failure mode effect analysis (DFMEA)

Details Design failure mode effect analysis (DFMEA) Design failure mode effect analysis (DFMEA)

2006-04-25

2006-04-25

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

C702S183000, C702S187000

Reexamination Certificate

active

07035769

ABSTRACT:
A Design Failure Mode Effect Analysis (DFMEA) method analyzes faults and failures in the design phase of electronic devices. A data-entry mask is used for recording some information concerning the performed analysis and a portion of the recording form is displayed to a user in an electronic display format. The method detects and records past design problems and their corresponding solutions, by a DFMEA method using the data-entry mask form; associates keywords in a database with each problem; associates data concerning each of the design problems, in the same database, including information concerning past fails occurred in similar applications; detects major changes and/or innovations, as well as any improved block or part of a new device with respect to other devices, thereby postulating possible new problems introduced by the new device; and records the new problems and their possible solutions, by the DFMEA method and using the form.

REFERENCES:
patent: 5109380 (1992-04-01), Ogino
patent: 5586252 (1996-12-01), Barnard et al.
patent: 6094649 (2000-07-01), Bowen et al.
patent: 2002/0194219 (2002-12-01), Bradley et al.
Onodera, “Effective techniqes of FMEA at each life-cycle stage”, Jan. 13-16 1997, IEEE, 1997 Proceedings, Annual Reliability and Maintainability Symposium, pp. 50-56.

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