Image analysis – Applications – Range or distance measuring
Patent
1997-05-21
1999-03-02
Rogers, Scott
Image analysis
Applications
Range or distance measuring
382108, 382141, 382255, G06K 900, G06K 936
Patent
active
058781528
ABSTRACT:
The invention provides a method and apparatus for obtaining a range image of an object. The method includes the act of "albedo normalization", i.e., removing the effects of object reflectance using a structured illumination image of the object and a uniform illumination image of the object to provide an albedo-normalized image. This image is then processed using a focus measure to provide a focal image, which image is then used to provide a range image. The invention substantially removes the effects of object reflectance from an image acquired using structured illumination, so that only the structured illumination pattern and its degree of focus/defocus remains. Albedo normalization is achieved by dividing an image of an object taken under structured illumination by a corresponding image of the object taken under uniform illumination. The albedo normalization act removes the primary source of noise in range images obtained using a depth from defocus or depth from focus of structured illumination technique, by removing spurious image frequencies from the image before processing by a focus measure. The albedo normalization act permits the depth from defocus and depth from focus techniques to be used for one or more focal positions, and over a broad range of materials of interest in machine vision.
REFERENCES:
patent: 4472056 (1984-09-01), Nakagawa et al.
patent: 4581762 (1986-04-01), Lapidus et al.
patent: 4640620 (1987-02-01), Schmidt
patent: 4689480 (1987-08-01), Stern
patent: 4876455 (1989-10-01), Sanderson et al.
patent: 4893183 (1990-01-01), Nayar
patent: 4912336 (1990-03-01), Nayar et al.
patent: 4948258 (1990-08-01), Caimi
patent: 4965442 (1990-10-01), Girod et al.
patent: 4984893 (1991-01-01), Lange
patent: 4988202 (1991-01-01), Nayar et al.
patent: 5003166 (1991-03-01), Girod
patent: 5151609 (1992-09-01), Nakagawa et al.
patent: 5239178 (1993-08-01), Derndinger et al.
patent: 5248876 (1993-09-01), Kerstens et al.
patent: 5424835 (1995-06-01), Cosnard et al.
patent: 5546189 (1996-08-01), Svetkoff et al.
patent: 5589942 (1996-12-01), Gordon
patent: 5617209 (1997-04-01), Svetkoff et al.
patent: 5659420 (1997-08-01), Wakai et al.
A. Pentland, S. Scherock, T. Darrell, and B. Girod. "Simple range cameras based on focal error," J. Opt. Soc. Am. A., vol. 11, No. 11, Nov. 1994, pp. 2925-2934.
B. Girod, and S. Scherock "Depth from Defocus of Structured Light," SPIE vol. 1194 Optics, Illimination, and Image Sensing for Machine Vision IV (1989), pp. 209-215.
P. Caber, "Interferometric profiler for rough surfaces," Applied Optics, vol. 32, No. 19, 1 Jul. 1993, pp. 3438-3441.
S. Nayar and Y. Nakagawa, "Shape from Focus," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 16, No. 8, Aug. 1994, pp. 824-830.
Y. Xiong and S. Shafer, "Depth from Focusing and Defocusing," Proc. IEEE Conference on Computer Vision and Pattern Recognition 1993, pp. 68-73.
J. Wyant, "How to extend interferometry for rough surface tests," Laser Focus World, Sep. 1993, pp. 131-133.
J.-A. Beraldin, M. Rioux, F. Blais, and R. A. Couvillon, "Digital Three-dimensional Imaging in the Infrared at the National Research Council of Canada," SPIE vol. 2269 Infrared Technology XX (1994), pp. 208-225.
Z.J. Geng, "Rainbow three-dimensional camera: new concept of high-speed three-dimensional vision systems," Optical Engineering, vol. 35 No. 2, Feb. 1996, pp. 376-383.
M. Watanabe and S. Nayar, "Telecentric Optics for Constant-Magnification Imaging," Technical Report CUCS-026-95, Dept. of Computer Science, Columbia University, New York, NY, USA, Sep. 1995.
M. Watanabe, S. Nayar, and M. Noguchi, "Active Focus Range Sensor," Implementation Technical Note, Dept. of Computer Science, Columbia University, New York, NU, USA, Jun. 1995.
M. Watanabe, S. Nayar, and M. Noguchi, "Real-time computation of depth from defocus," Proc. of SPIE v 2599, 1996, pp. 14-25.
S. Nayar, M. Watanabe, and M. Noguchi, "Real-Time Focus Range Sensor," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 18, No. 12, Dec. 1996, pp. 1186-1198.
M. Noguchi and S. Nayar, Microscopic Shape from Focus Using Active Illumination, Proc. IEEE Conference on Computer Vision and Image Processing 1994, pp. 147-152.
M. Subbarao and G. Surya, "Depth from Defocus: A Spatial Domain Approach," International Journal of Computer Vision, 13, 3, 1994, pp. 271-294.
R. Stone and S. Shafer, "Surface Roughness Estimation," The Robotics Institute, Carnegie Mellon University, Pittsburgh, PA, USA,.
A. Pentland, "A New Sense for Depth of Field," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. PAMI-9, No. 4, Jul. 1987, pp. 523-531.
M. Ishihara and H. Sasaki, "High Speed 3-D Shape Measuring Apparatus using Shape from Focus Method," Seimitsu Kogaku Kaishi (Precision Engineering Journal), vol. 63, No. 1, 1997, pp. 124-128.
"Confocal Microscopy," Optical Instruments, pp. 17.40-17.43.
R. Webb, "Confocal Microscopes," Optics & Photonics News Jul. 1991, pp. 8-13.
R. Schneider, A. Schick, P. Kollensperger, and T. Ninomiya, "High-speed optical three-dimensional scanner for automatic solder joint inspection," Optical Engineering, vol. 36, No. 10, Oct. 1997, pp. 2878-2885.
M. Ishihara, "High speed 3-D Shape Measurement for a Small Object," Dai Ni-kai Gazou Senshing Shinpojiumu Kouen Ronbunshuu (Collection of the Lectures at the 2nd Image Sensing Symposium), Jun. 1996, pp. 155-158.
M. Ishihara and H. Sasaki, "High Speed 3-D Shape Measurement Using Non-Scanning Multibeam Confocal Lens System," Dai San-kai Gazou Senshing Shinpojiumu Kouen Ronbunshuu (Collection of the Lectures at the 3rd Image Sensing Symposium).
T. Yamashita and H. Nakashima; M. Nagashima and K. Nishiuchi, "Measuring longitudinal displacements using laser beam diffraction changes near the focal point," Rev. Sci. Instrum., vol. 64, No. 8, Aug. 1993, pp. 2245-2249.
Patent Abstracts of Japan, vol. 8, No. 6 (P-247) '1443| , 12 Jan. 1984 & JP 58 169008 A (Nippon Denki K.K.), 5 Oct. 1983.
Cognex Corporation
Rogers Scott
Weinzimmer Russ
LandOfFree
Depth from focal gradient analysis using object texture removal does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Depth from focal gradient analysis using object texture removal , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Depth from focal gradient analysis using object texture removal will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-430054