Deposition method for nanostructure materials

Chemistry: electrical and wave energy – Processes and products – Electrophoresis or electro-osmosis processes and electrolyte...

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Reexamination Certificate

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08002958

ABSTRACT:
A method for depositing a coating of a nanostructure material onto a substrate includes: (1) forming a solution or suspension of containing the nanostructure material; (2) selectively adding “chargers” to the solution; (3) immersing electrodes in the solution, the substrate upon which the nanostructure material is to be deposited acting as one of the electrodes; (4) applying a direct and/or alternating current electrical field between the two electrodes for a certain period of time thereby causing the nanostructure materials in the solution to migrate toward and attach themselves to the substrate electrode; and (5) subsequent optional processing of the coated substrate.

REFERENCES:
patent: 3037923 (1962-06-01), Gnau
patent: 3794593 (1974-02-01), Coenen et al.
patent: 4500397 (1985-02-01), Mori
patent: 5296117 (1994-03-01), De Jaeger et al.
patent: 5906721 (1999-05-01), Bojkov et al.
patent: 6057637 (2000-05-01), Zettl et al.
patent: 6258237 (2001-07-01), Gal-Or et al.
patent: 6264816 (2001-07-01), Borra
patent: 6277318 (2001-08-01), Bower et al.
patent: 6280697 (2001-08-01), Zhou et al.
patent: 6333968 (2001-12-01), Whitlock et al.
patent: 6334939 (2002-01-01), Zhou et al.
patent: 6342755 (2002-01-01), Russ et al.
patent: 6401526 (2002-06-01), Dai et al.
patent: 6420293 (2002-07-01), Chang et al.
patent: 6422450 (2002-07-01), Zhou et al.
patent: 6456691 (2002-09-01), Takahashi et al.
patent: 6457350 (2002-10-01), Mitchell
patent: 6462467 (2002-10-01), Russ
patent: 6528785 (2003-03-01), Nakayama et al.
patent: 6553096 (2003-04-01), Zhou et al.
patent: 6616497 (2003-09-01), Choi et al.
patent: 6630772 (2003-10-01), Bower et al.
patent: 6652967 (2003-11-01), Yadav et al.
patent: 6787122 (2004-09-01), Zhou
patent: 6824755 (2004-11-01), Colbert et al.
patent: 6850595 (2005-02-01), Zhou et al.
patent: 6875329 (2005-04-01), Washizu et al.
patent: 6876724 (2005-04-01), Zhou et al.
patent: 6879143 (2005-04-01), Nagahara et al.
patent: 6897603 (2005-05-01), Mao et al.
patent: 6902658 (2005-06-01), Talin
patent: 6980627 (2005-12-01), Qiu et al.
patent: 7014743 (2006-03-01), Zhou et al.
patent: 7252749 (2007-08-01), Zhou et al.
patent: 7455757 (2008-11-01), Oh et al.
patent: 7887689 (2011-02-01), Zhou et al.
patent: 2002/0094064 (2002-07-01), Zhou et al.
patent: 2002/0140336 (2002-10-01), Stoner et al.
patent: 2002/0193040 (2002-12-01), Zhou
patent: 2003/0002627 (2003-01-01), Espinosa et al.
patent: 2003/0044519 (2003-03-01), Takai
patent: 2003/0094035 (2003-05-01), Mitchell
patent: 2003/0102222 (2003-06-01), Zhou et al.
patent: 2003/0111946 (2003-06-01), Talin
patent: 2003/0180472 (2003-09-01), Zhou et al.
patent: 2003/0233871 (2003-12-01), Nguyen et al.
patent: 2004/0028183 (2004-02-01), Lu et al.
patent: 2004/0038251 (2004-02-01), Smalley et al.
patent: 2004/0055892 (2004-03-01), Oh et al.
patent: 2004/0108298 (2004-06-01), Gao
patent: 2004/0240616 (2004-12-01), Qiu et al.
patent: 2004/0256975 (2004-12-01), Gao et al.
patent: 2005/0133372 (2005-06-01), Zhou et al.
patent: 2005/0226361 (2005-10-01), Zhou et al.
patent: 2005/0269559 (2005-12-01), Zhou et al.
patent: 2005/0281379 (2005-12-01), Qiu et al.
patent: 2006/0008047 (2006-01-01), Zhou et al.
patent: 2006/0018432 (2006-01-01), Zhou et al.
patent: 2006/0244364 (2006-11-01), Nakamoto
patent: 2008/0099339 (2008-05-01), Zhou et al.
patent: 1273215 (2000-11-01), None
patent: 0989579 (1999-09-01), None
patent: 2353138 (2001-02-01), None
patent: A 08170193 (1996-07-01), None
patent: A 10237362 (1998-09-01), None
patent: A2000141056 (2000-05-01), None
patent: 2001-020093 (2001-01-01), None
patent: 2001110303 (2001-04-01), None
patent: 2001167692 (2001-06-01), None
patent: A2001283716 (2001-10-01), None
patent: 2001-312955 (2001-11-01), None
patent: 2002301700 (2002-10-01), None
patent: 2002-367543 (2002-12-01), None
patent: 2003-100202 (2003-04-01), None
patent: 2001-75925 (2001-08-01), None
patent: 03075372 (2003-09-01), None
Second non-final Office Action from the Japanese Patent Office dated Feb. 13, 2009 for Japanese Patent Application No. 2003-573718.
First Office Action from Chinese Patent Office dated Dec. 26, 2008 for Chinese Patent Application No. 200480025996.6.
Chinese Office Action for Chinese Patent Application No. 02827708.2 dated Jan. 12, 2007.
Zhengping et al., “Progress in Bulk-Optic-Material Current Sensors”,Lasers and optoelectronics progress 1999, vol. 36, 8, pp. 6-12.
Office Action from the Korean Intellectual Property Office for Korean Patent Application No. 10-2006-7000476 dated Feb. 19, 2008.
http://web.archive.org/web/20030507193839/http:snf.sanford.edu/Process/Lithography/liftoff.html, edited Aug. 14, 2000.
International Search Report for PCT/US04/20150 dated Mar. 10, 2006.
International Preliminary Report for PCT/US2004/020150 dated Apr. 6, 2006.
International Search Report for Application No. PCT/US02/37184 dated Jun. 21, 2004.
Yang et al., “Magnetic Nanowire Based High Resolution Magnetic Force Microscope Probes”, Applied Physics Letter 87 (2005).
Hartmann, U., “Magnetic Force Microscopy”, Annu, Rev. Mater. Sci. 1999. 29: p. 53-87.
J.H. Hafner et al., “Structural and Functional Imaging with Carbon Nanotube AFM Probes”, Progress in Biophysics & Molecular Biology, 2001. 77: p. 73-110.
T. Larsen et al., “Comparison of Wear Characteristics of Etched-Silicon and Carbon Nanotube Atomic-Force Microscopy Probes”, Appl. Phys. Lett., 2002. 80(11): p. 1996-1998.
T. Arie et al., “Carbon-nanotube probe equipped magnetic force microscope”,J. Vac. Sci. Technol. B., 2002. 18: p. 104.
H. Cui et al., “Growth of Carbon Nanofibers on Tipless Cantilevers for High Resolution Topography and Magnetic Force Imaging”, Nano Letters, 2004. 4(11): p. 2157-2161.
H. Kuramochi et al., “A Magnetic Force Microscope Using CoFe-Coated Carbon Nanotube Probes”, Nanotechnology, 2005. 16: p. 24-27.
Z. Deng et al., “Metal-Coated Carbon Nanotube Tips for Magnetic Force Microscope”, Applied Physics Letter, 2004. 85(25): p. 6263.
Jones, T.B., “Electromechanics of Particles”, 1995. Cambridge: Cambridge Univ. Press. pp. 34-49.
Jie Tang et al., “Rapid and Reproducible Fabrication of Carbon Nanotube AFM Probes by Dielectrophoresis”, Nano Letters, “in press”.
R. Stevens et al., “Improved fabrication approach for carbon nanotube probe devices”, Appl. Phys. Lett., vol. 77, No. 21, Nov. 20, 2000, pp. 3453-3455.
J. Hafner et al.,“Growth of nanotubes for probe microscopy tips”, Nature, vol. 398, Apr. 29, 1999, pp. 761-762.
H. Dai et al.,“Nanotubes as nanoprobes in scanning probe microscopy”. Nature, vol. 384, Nov. 14, 1996, pp. 147-150.
Office Action Restriction Requirement dated Aug. 8, 2003 for U.S. Appl. No. 09/996,695.
Office Action-non final action dated Dec. 1, 2003 for U.S. Appl. No. 09/996,695.
Office Action-final action dated May 26, 2004 for U.S. Appl. No. 09/996,695.
Office Action-non final action dated Feb. 17, 2005 for U.S. Appl. No. 09/996,695.
Notice of Allowance dated Apr. 3, 2007 for U.S. Appl. No. 09/996,695.
Office Action Restriction Requirement dated Oct. 11, 2006 for U.S. Appl. No. 10/615,842.
Office Action-non final action dated Feb. 5, 2007 for U.S. Appl. No. 10/615,842.
Office Action-final action dated Sep. 10, 2007 for U.S. Appl. No. 10/615,842.
Office Action-non final action dated Jan. 15, 2008 for U.S. Appl. No. 10/615,842.
Office Action-non final action dated Mar. 28, 2008 for U.S. Appl. No. 10/842,357.
Office Action Restriction Requirement dated Jan. 4, 2005 for U.S. Appl. No. 10/730,068.
Office Action-non final action dated Apr. 21, 2005 for U.S. Appl. No. 10/730,068.
Notice of Allowance dated Oct. 12, 2005 for U.S. Appl. No. 10/730,068.
Office Action from Japanese Patent Office for Japanese Patent Application No. 2003-573718 dated Jun. 16, 2008.
Korean Intellectual Property Office (KIPO) Office Action for Korean Patent Application No. 10-2006-7000476 dated Jun. 19, 2007.
Third Office Action dated Aug. 1, 20

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