Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1990-05-24
1991-07-02
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
350370, 356334, G01J 318, G01J 302
Patent
active
050281348
ABSTRACT:
Light measuring instruments have a sensitivity to polarization states of the light being measured. To minimize such sensitivity a depolarizer is used. The depolarizer includes a half wave polarization plate between the source of light being measured and the light measuring instrument or within the instrument, but ahead of the polarizing elements. The half wave plate is rotated through an angular sector of at least 90.degree. (.pi./2 radians) for each measurement period to ensure that all polarization states are measured. If the measurement period is sufficiently long, its half wave plate may be rotated asynchronously with respect to the measurement period through at least two and one-half revolutions.
REFERENCES:
patent: 4699512 (1987-10-01), Koshi
Billings, Journal of the Optical Society of America, vol. 41, Dec. 1951, pp. 966-975.
Hughes, Review of Scientific Instruments, vol. 31, 1960, pp. 1156-1157.
Rahn et al., Applied Spectroscopy, vol. 25, No. 6, 1971, pp. 675-677.
Bulpitt Thomas H.
Skouras Nicos P.
Evans F. L.
Kollmorgen Instruments
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