Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent
1974-07-25
1976-03-09
McGraw, Vincent P.
Optics: measuring and testing
Inspection of flaws or impurities
Bore inspection
250559, 356204, 356205, G01N 2122
Patent
active
039428982
ABSTRACT:
A densitometer for providing an output which is a function of the density of a film badge in a photodosimeter system. The light passing through the film badge is received by a photodiode which generates a current signal which is directly proportional to the intensity of the received light. The current signal is converted to a voltage signal, the converting means being biased so that the voltage signal is zero when no light is received by the photodiode. The voltage signal is applied, together with a reference voltage, to a log-ratio circuit which generates an output signal proportional to the log of the ratio of the reference voltage to the voltage signal, the output of the log-ratio circuit being displayed. A circuit is operative, when the film badge is removed from the light path, to adjust the reference voltage until the output of the log-ratio circuit is zero.
REFERENCES:
patent: 3765778 (1973-10-01), Bey et al.
patent: 3807875 (1974-04-01), Fisher et al.
Beckman Instruments Inc.
McGraw Vincent P.
Meads R. R.
Steinmeyer R. J.
LandOfFree
Densitometer for measuring the density of an optical element suc does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Densitometer for measuring the density of an optical element suc, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Densitometer for measuring the density of an optical element suc will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-830736