Densitometer for measuring specular reflectivity

Details Densitometer for measuring specular reflectivity Densitometer for measuring specular reflectivity

1988-09-19

1991-02-05

Rosenberger, Richard A.

Optics: measuring and testing

Of light reflection

356446, G01N 2147

Patent

active

049899856

ABSTRACT:
An infrared densitometer which measures the reduction in the specular component of reflectivity as marking particles are progressively deposited on a moving photoconductive belt. Collimated light rays are projected onto the marking particles. The light rays reflected from at least the marking particles are collected and directed onto a photodiode array. The photodiode array generates electricl signals proportional to the total flux and the diffuse component of the total flux of the reflected light rays. Circuitry compares the electrical signals and determines the difference therebetween to generate an electrical signal proportional to the specular component of the total flux of the reflected light rays.

REFERENCES:
patent: 2315282 (1943-03-01), Snow
patent: 4054391 (1977-10-01), Witte
patent: 4226541 (1980-10-01), Tisue
patent: 4284356 (1981-08-01), Heilman
patent: 4553033 (1985-11-01), Hubble, III et al.
patent: 4652115 (1987-03-01), Palm et al.
patent: 4796065 (1989-01-01), Kanbayashi

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