Demagnification measurement method for charged particle beam...

Radiant energy – Means to align or position an object relative to a source or...

Reexamination Certificate

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C250S492300, C250S492100, C250S492200, C250S492220

Reexamination Certificate

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07439525

ABSTRACT:
A method for measuring a demagnification of a charged particle beam exposure apparatus includes measuring a first stage position of a mask stage in accordance with a mask stage coordinate system, irradiating a first charged particle beam to a first irradiation position on a specimen through the opening portion of the mask, measuring the first irradiation position in accordance with a specimen stage coordinate system, moving the mask stage to a second stage position, measuring the second stage position of the mask stage, irradiating a second charged particle beam to a second irradiation position on the specimen through the opening portion of the mask measuring the second irradiation position in accordance with the specimen stage coordinate system, and calculating a demagnification of the charged particle beam exposure apparatus from the first and second stage positions and the first and second irradiation positions.

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patent: 5912467 (1999-06-01), Okino
patent: 5912469 (1999-06-01), Okino
patent: 5973333 (1999-10-01), Nakasuji et al.
patent: 6111646 (2000-08-01), Naulleau et al.
patent: 6331885 (2001-12-01), Nishi
patent: 2004/0026634 (2004-02-01), Utsumi et al.
patent: 7-22349 (1995-01-01), None

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