Measuring and testing – Vibration – By mechanical waves
Patent
1998-04-03
1999-11-09
Oda, Christine K.
Measuring and testing
Vibration
By mechanical waves
73 182, G01N 2924
Patent
active
059792418
ABSTRACT:
An ultrasonic probe includes an ultrasonic transducer; a delay line acoustically coupled to the transducer so that ultrasonic vibrations may be transmitted into the delay line from the ultrasonic transducer in a first direction, the delay line includes a first section and a second section; the first and second sections forming an interface that is substantially perpendicular to the first direction; and the second section including a surface for coupling with a material to be investigated. The probe can be used to measure a thickness of a coating on a substrate by transmitting a signal in a first direction from the transducer into the delay line; measuring a time t.sub.1 for a first portion of the signal to travel round trip from the transducer and the interface; using the measured time t.sub.1 to calculate an expected time t.sub.2 for a second portion of the signal to travel round trip from the transducer to an opposite face of the delay line; measuring a time t.sub.3 that it takes for a third portion of the signal to travel round trip from the transducer and an interface between the coating and the substrate; and calculating a thickness of the coating based on a difference between the time t.sub.2 and the time t.sub.3.
REFERENCES:
patent: 3237251 (1966-03-01), Thalman
patent: 3427866 (1969-02-01), Weighart
patent: 3486368 (1969-12-01), Brech
patent: 3554013 (1971-01-01), Berg
patent: 3663842 (1972-05-01), Miller
patent: 3690154 (1972-09-01), Wells
patent: 3918296 (1975-11-01), Kitada
patent: 4016530 (1977-04-01), Goll
patent: 4050292 (1977-09-01), Bloch
patent: 4100808 (1978-07-01), Evans
patent: 4102205 (1978-07-01), Pies et al.
patent: 4153894 (1979-05-01), Alphonse et al.
patent: 4182155 (1980-01-01), Fowler
patent: 4324141 (1982-04-01), Stearn
patent: 4366406 (1982-12-01), Smith
patent: 4383194 (1983-05-01), Ohigashi et al.
patent: 4393711 (1983-07-01), Lapides
patent: 4437332 (1984-03-01), Pittaro
patent: 4445360 (1984-05-01), Treder, Jr.
patent: 4567747 (1986-02-01), Matay
patent: 4715008 (1987-12-01), Jones
patent: 4738131 (1988-04-01), Euverard
patent: 4756808 (1988-07-01), Utsumi et al.
patent: 4771205 (1988-09-01), Mequio
patent: 4961347 (1990-10-01), Arakawa et al.
patent: 5095754 (1992-03-01), Hsu et al.
patent: 5156636 (1992-10-01), Kuljis
Krautkramer, J., et al. Ultrasonic Testing of Materials, N.Y., Springer-Vertag, 1983. p. 620, Table A.1.
McMaster, R.C. Nondestructive Testing Handbook, N.Y., The Ronald Press Co., 1959. pp. 43-48 (no month).
DeFelsko Corporation
Oda Christine K.
LandOfFree
Delay line for an ultrasonic probe and method of using same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Delay line for an ultrasonic probe and method of using same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Delay line for an ultrasonic probe and method of using same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1442163