Measuring and testing – Vibration – By mechanical waves
Patent
1985-01-10
1986-08-05
Kreitman, Stephen A.
Measuring and testing
Vibration
By mechanical waves
333138, G01N 2900
Patent
active
046035869
ABSTRACT:
An analogue delay line circuit arrangement is constructed by a plurality of delay line elements and a plurality of compensation amplifiers. These delay line elements and compensation amplifiers are series-connected, one by one, so as to construct a cascade connection. The input echo signals are delayed in the delay line elements and simultaneously the amplitudes thereof abruptly decrease at the high frequency range. The cascade-connected amplifiers can compensate for the abrupt decrease of the signal amplitudes. The delay line elements are constructed of passive elements such as the capacitors and inductors. The compensation amplifiers are constructed of active elements such as the emitter follower transistor.
REFERENCES:
patent: 4005382 (1977-01-01), Beaver
patent: 4180791 (1979-12-01), Tiemann
patent: 4291286 (1981-09-01), Wagner
patent: 4302735 (1981-11-01), Nibby, Jr. et al.
patent: 4330875 (1982-05-01), Tachita et al.
patent: 4425634 (1984-01-01), Iino et al.
Kabushiki Kaisha Toshiba
Kreitman Stephen A.
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