Delay element calibration

Details Delay element calibration Delay element calibration

2006-04-04

2006-04-04

Assouad, Patrick J. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C326S093000, C331S044000, C714S798000, C702S089000, C702S106000, C702S107000

Reexamination Certificate

active

07024324

ABSTRACT:
A method for calibrating a delay element is described herein. In some embodiments, the method may include generating a clock signal with a clock edge, generating a reference signal with a reference edge using an adjustable delay line to delay the clock signal, and delaying a selected one of the clock signal and the reference signal through an array delay line having an array delay element with an array delay. In some embodiments, the method may further include adjusting the adjustable delay line to obtain a first adjustable delay so that the clock and reference edges are aligned on one side of the array delay element, adjusting the adjustable delay line to obtain a second adjustable delay so that the clock and reference edges are aligned on the other side of the array delay element, and ascertaining a delay difference between the first and the second adjustable delays to determine a value of the array delay provided by the array delay element. Other embodiments of the present invention may include, but are not limited to, apparatuses and systems adapted to facilitate practice of the above-described method.

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