Delay amount measurement method

Details Delay amount measurement method Delay amount measurement method

2007-03-27

2007-03-27

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S089000, C702S176000

Reexamination Certificate

active

11251600

ABSTRACT:
There is provided a delay amount measuring method of measuring a delay amount in an electronic device that outputs an output signal according to an input signal. The method includes a conversion step of converting the input signal and the output signal into digital data, a shift step of sequentially shifting the digital data of either of the input signal or the output signal in a time direction, an error computing step of computing a squared error of the digital data of the input signal and the digital data of the output signal with respect to each shift amount in the shift step, and a delay amount computing step of computing the shift amount when the squared error is a minimum value by means of a nonlinear least squares method and using the computed shift amount as the delay amount in the electronic device.

REFERENCES:
Kijima et al. , “HMD with time delay compensation capability”, Proceedings of International Symposium on Mixed Reality 2001 (Mar. 14-15, 2001, Yokohama Japan).

Affiliated with

Also associated with

Rating

Delay amount measurement method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Delay amount measurement method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Delay amount measurement method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3800401