Deflection signal compensation for charged particle beam

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S492100, C250S492200, C250S493100, C250S397000, C250S398000

Reexamination Certificate

active

07569841

ABSTRACT:
Charged particles that are in transit through a deflection system when the beam is repositioned do not received the correct deflection force and are misdirected. By independently applying signals to the multiple stages of a deflection system, the number of misdirected particles during a pixel change is reduced.

REFERENCES:
patent: 5180918 (1993-01-01), Isobe
patent: 5225684 (1993-07-01), Taki et al.
patent: 5770863 (1998-06-01), Nakasuji
patent: 5916424 (1999-06-01), Libby et al.
patent: 6354438 (2002-03-01), Lee et al.
patent: 6649919 (2003-11-01), Chao et al.
patent: 6774379 (2004-08-01), Hashimoto et al.
patent: 11238671 (1999-08-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Deflection signal compensation for charged particle beam does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Deflection signal compensation for charged particle beam, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Deflection signal compensation for charged particle beam will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4059393

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.