Deflection based daughter ion selector

Details Deflection based daughter ion selector Deflection based daughter ion selector

1995-11-22

1998-10-13

Berman, Jack I.

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

250294, 250305, 250396R, H01J 4940, H01J 4928

Patent

active

058215344

ABSTRACT:
A method and apparatus for analyzing ions by determining times of flight including using a deflectron based daughter ion selector for selecting daughter ions. Parent ions generated in an ion source may fragment to form daughter ions. Daughter ions may further fragment to form grand daughter ions. By selecting a specific type of daughter ion from ions formed in the ion source, one may obtain a grand daughter ion spectrum. According to the present invention, a deflectron based daughter ion selector, in the form of two deflectron and a set of selection plates, is used as a daughter ion selector.

REFERENCES:
patent: 4472631 (1984-09-01), Enke et al.
patent: 4962308 (1990-10-01), Bormans et al.

Affiliated with

Also associated with

Rating

Deflection based daughter ion selector does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Deflection based daughter ion selector, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Deflection based daughter ion selector will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-315006