Deflection angle measuring device, optical signal switching...

Optics: measuring and testing – Angle measuring or angular axial alignment – Plural scales or different portions of same scale...

Reexamination Certificate

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C385S015000

Reexamination Certificate

active

06975389

ABSTRACT:
A light of measurement emitted from a semiconductor laser (1) is incident to a beam splitter formed by a prism (4). The light of measurement transmits into an incident surface (3) having a positive power so as to be emitted to a reflecting surface (5c) of measurement. A light reflected there is returned by a beam splitting surface (4a) so as to be reflected by a concave reflecting surface (6). The reflected light is returned so as to be condensed and focused on a light receiving surface (8) of sensor in a light measuring device (7). A position of a spot of light which is received is measured so as to measure the deflection angle of a rotating mirror (5). By doing this, it is possible to form a compact device even if the length of the optical path is long. As a result, it is possible to broaden the deflection angle measuring range.

REFERENCES:
patent: 5046843 (1991-09-01), Keren
patent: 5760944 (1998-06-01), Minakuchi et al.
patent: 2004/0027561 (2004-02-01), Takahashi et al.
patent: 2004/0091200 (2004-05-01), Ikegame
patent: 02-289928 (1990-11-01), None
patent: 08-227552 (1996-09-01), None
patent: 11-144273 (1999-05-01), None
patent: 11-144274 (1999-05-01), None

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