Defective pixel detecting circuit of a solid state image pick-up

Details Defective pixel detecting circuit of a solid state image pick-up Defective pixel detecting circuit of a solid state image pick-up

1996-08-12

1998-12-29

Garber, Wendy

Television

Camera, system and detail

Combined image signal generator and general image signal...

H04N 5335

Patent

active

058546553

ABSTRACT:
Image pick-up device reads image pick-up signals of all the pixels of CCD2 once when an optical system is in light intercepted state. By comparing the image pick-up signal from each pixel with a first threshold value THL1, a possibly defective pixels are extracted. Thereafter, by reading the image pick-up signals for a prescribed number of times from the CCD2, accumulated value of the image pick-up signals of each of the possibly defective pixels is calculated. Based on the result of comparison between the accumulated value corresponding to each of the possibly defective pixels and second threshold value THL2, an actually defective pixel is specified from the possibly defective pixels.

REFERENCES:
patent: 4893185 (1990-01-01), Fukushima et al.
patent: 5047861 (1991-09-01), Houchin et al.
patent: 5625413 (1997-04-01), Katoh et al.
K.A. Bushaw et al., "Bad Pel Detection and Correction", IBM Technical Disclosure Bulletin, vol. 24, No. 11B, Apr. 1982, pp. 5898-5899.

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