Measuring and testing – Vibration – By mechanical waves
Reexamination Certificate
2005-08-02
2005-08-02
Williams, Hezron (Department: 2856)
Measuring and testing
Vibration
By mechanical waves
C073S600000, C073S602000, C073S628000
Reexamination Certificate
active
06923067
ABSTRACT:
The invention relates to a method for non-destructive testing of materials, in which at least two differently guided waves (modes) are produced in the solid body, each at at least one specified angle, the measured reflection values are placed in relation to a reference echo in order to obtain a relative reflection value, and the relative reflection values of the individual modes are again placed in relation to one another, thereby enabling the size and type of the defects to be determined.
REFERENCES:
patent: 3996791 (1976-12-01), Niklas et al.
patent: 4092868 (1978-06-01), Thompson et al.
patent: 4100809 (1978-07-01), Bobrov et al.
patent: 4248092 (1981-02-01), Vasile et al.
patent: 4313070 (1982-01-01), Fisher
patent: 4366711 (1983-01-01), Weilbacher et al.
patent: 4372163 (1983-02-01), Tittmann et al.
patent: 4570487 (1986-02-01), Gruber
patent: 4658649 (1987-04-01), Brook
patent: 4674334 (1987-06-01), Chimenti et al.
patent: H924 (1991-06-01), Chimenti
patent: 5035144 (1991-07-01), Aussel
patent: 5078013 (1992-01-01), Kuramochi et al.
patent: 5212988 (1993-05-01), White et al.
patent: 5251486 (1993-10-01), Thompson et al.
patent: 5460131 (1995-10-01), Kroning et al.
patent: 5469743 (1995-11-01), Zorn
patent: 5604301 (1997-02-01), Mountford et al.
patent: 5734588 (1998-03-01), Rose et al.
patent: 5866820 (1999-02-01), Camplin et al.
patent: 5932806 (1999-08-01), Rose et al.
patent: 6062083 (2000-05-01), Dunegan
patent: 6105431 (2000-08-01), Duffill et al.
patent: 6164135 (2000-12-01), Bicz
patent: 6173613 (2001-01-01), Dunegan
patent: 6341525 (2002-01-01), Takada et al.
patent: 6393917 (2002-05-01), Suh
patent: 6429650 (2002-08-01), Kwun et al.
patent: 6446509 (2002-09-01), Takada et al.
patent: 6487909 (2002-12-01), Harrold et al.
patent: 6502463 (2003-01-01), Clark et al.
patent: 6581014 (2003-06-01), Sills et al.
patent: 33 09 470 (1984-09-01), None
patent: 41 33 648 (1999-04-01), None
patent: 158 929 (1985-10-01), None
patent: 276 308 (1988-08-01), None
patent: 11-23543 (1999-01-01), None
Krautkrämer, et al., “Ultrasonic Testing of Materials”, Springer-Verlag Berlin Heidelberg New York 1977.
Krautkramer, “Emerging Technology—Guided Wave Ultrasonics”NDTnet, Jun. 1998, vol. 3, No. 6.
Coen Gunther
Lunh Ernst
Oberhoff Dietmar
Betriebsforschungsinstitut VDEH Institut fur Angewandte Forschun
Saint-Surin Jacques M.
Williams Hezron
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