Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2007-06-12
2007-06-12
Stafira, Michael P. (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
C430S005000
Reexamination Certificate
active
10885641
ABSTRACT:
A defect repair device includes a defect inspection unit configured to find a size of a protruding defect on a front surface of a multi-layer film having a rear surface opposite to the front surface, a calculation unit configured to calculate a repair energy so as to repair the protruding defect based on the size of the protruding defect found by the defect inspection unit, an energy supplier, and an energy controller configured to control the energy supplier to supply the repair energy calculated by the calculation unit to a portion in the multi-layer film from the rear surface of the multi-layer film so as to cause a decrease in a volume of the portion and retract the protruding defect into the multi-layer film.
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Ikuta Yoshiaki
Uno Toshiyuki
Asahi Glass Company Ltd.
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Stafira Michael P.
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