Defect management database for managing manufacturing...

Details Defect management database for managing manufacturing... Defect management database for managing manufacturing...

2006-02-28

2006-02-28

Truong, Cam-Y (Department: 2162)

Data processing: database and file management or data structures

Database design

Data structure types

C707S793000, C707S793000

Reexamination Certificate

active

07007038

ABSTRACT:
A manufacturing quality information database structure is useful for tracking quality information relating to a manufacturing process. Accurate tracking of symptoms, defects, and actions (repairs) is achieved through data associations between symptom data entities, defect data entities, and action data entities. Further associations between symptom and symptom category data entities; defect and defect category data entities; and action and action category data entities may be used to increase the data tracking capabilities of the database. Moreover, manufacturing processes and process steps may be tracked by process and process step data entities that may also be associated with the symptom, defect and action data entities. Still further, a variety of different modules and module types may be tracked by including an item data entity that identifies each module.

REFERENCES:
patent: 6161101 (2000-12-01), Guinta et al.
patent: 6167401 (2000-12-01), Csipkes et al.
patent: 6381556 (2002-04-01), Kazemi et al.
patent: 6611728 (2003-08-01), Morioka et al.
patent: 6744266 (2004-06-01), Dor et al.
patent: 6801822 (2004-10-01), Fujiwara et al.

Affiliated with

Also associated with

Rating

Defect management database for managing manufacturing... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Defect management database for managing manufacturing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Defect management database for managing manufacturing... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3689378