Defect inspection system

Details Defect inspection system Defect inspection system

1981-02-20

1983-09-13

McGraw, Vincent P.

Optics: measuring and testing

Inspection of flaws or impurities

Having predetermined light transmission regions

356240, 250223B, G01N 2100

Patent

active

044038585

ABSTRACT:
A defect inspection system in which a reflector body is arranged at such an angle relative to an object to be inspected that in spite of any parallel movements of the image does not overlap the inspected object. The inspected object and the image thereof are both simultaneously picked up by the same television camera. Then, the video signal from the television camera is fed to a processor which then inspects whether or not the object to be inspected contains defects or flaws.

REFERENCES:
patent: 4025201 (1977-05-01), Deane

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