Defect inspection of objects such as electronic circuits

Details Defect inspection of objects such as electronic circuits Defect inspection of objects such as electronic circuits

1976-06-30

1977-11-01

Wise, Edward J.

Boots, shoes, and leggings

178 6, 324 73PC, 358106, H04N 138

Patent

active

040567168

ABSTRACT:
Successive areas of a high-resolution object image are compared with corresponding areas of a low-resolution master pattern to produce signals representing the quality of the object. Comparison is effected by detecting which of a set of features occurs in each area of the object image, detecting which feature of the same set occurs in a larger area of the master pattern, and determining whether these two features are the same.

REFERENCES:
patent: 3463007 (1969-08-01), Jones et al.
patent: 3613081 (1971-10-01), Morimoto
patent: 3760355 (1973-09-01), Bruckert
patent: 3790767 (1974-02-01), Alexander
patent: 3812426 (1974-05-01), Illian
patent: 3816719 (1974-06-01), Trotel et al.
patent: 3887762 (1975-06-01), Uno et al.
patent: 3889053 (1975-06-01), Lloyd et al.
patent: 3908118 (1975-09-01), Micka
patent: 3991302 (1976-11-01), Danner

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