Defect inspection method of magnetic disk, device therefor,...

Dynamic magnetic information storage or retrieval – General processing of a digital signal – Data verification

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07636217

ABSTRACT:
Embodiments of the present invention efficiently conduct a test for detecting defects on a magnetic disk more accurately. According to one embodiment, a HDD carries out defect inspection of a magnetic disk using thermal fly height control (TFC). Changing a clearance by the TFC achieves defect inspection tests under varied test conditions without much decrease of throughput in manufacturing HDDs. First, a self analysis test (SAT) is carried out in a state that a heater power of P2is supplied to a heater. Then, another SAT is carried out in a state that a heater power of P1is supplied to the heater. The heater power P2is larger than the heater power P1.

REFERENCES:
patent: 5527110 (1996-06-01), Abraham et al.
patent: 5810477 (1998-09-01), Abraham et al.
patent: 6019503 (2000-02-01), Abraham et al.
patent: 6104557 (2000-08-01), Kasai et al.
patent: 6239936 (2001-05-01), Abraham et al.
patent: 6262572 (2001-07-01), Franco et al.
patent: 6266199 (2001-07-01), Gillis et al.
patent: 6310739 (2001-10-01), McEwen et al.
patent: 6311551 (2001-11-01), Boutaghou
patent: 6353315 (2002-03-01), Egan et al.
patent: 6976196 (2005-12-01), Watanabe
patent: 7545594 (2009-06-01), Olson
patent: 2006/0109000 (2006-05-01), Makino et al.
patent: 2007/0127147 (2007-06-01), Yokohata et al.
patent: 2007/0127148 (2007-06-01), Yokohata et al.
patent: 2007/0146920 (2007-06-01), Kitamura et al.
patent: 2008/0100966 (2008-05-01), Ozeki
patent: 06-309636 (1994-11-01), None
patent: 2004-185783 (2004-07-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Defect inspection method of magnetic disk, device therefor,... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Defect inspection method of magnetic disk, device therefor,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Defect inspection method of magnetic disk, device therefor,... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4116363

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.