Defect inspection method and apparatus for transparent...

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material

Reexamination Certificate

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C356S239500

Reexamination Certificate

active

07420671

ABSTRACT:
A defect inspection method and apparatus for a transparent plate material for detecting a bubble, a scratch, a foreign matter, and another defect existing on or in the transparent plate material including regarding a defect candidate as a defect, when the defect candidate is located in both first and second images, and regarding the defect candidate as a pseudo defect, when the defect candidate is located in only one of the first and second images.

REFERENCES:
patent: 7199386 (2007-04-01), Capaldo et al.
patent: 2005/0062961 (2005-03-01), Uto et al.
patent: 58-154229 (1983-09-01), None
patent: 8-201313 (1996-08-01), None
patent: 9-258197 (1997-10-01), None
patent: 10-339705 (1998-12-01), None
patent: 11-264803 (1999-09-01), None
patent: 2004-233338 (2004-08-01), None

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