Defect inspection method

Details Defect inspection method Defect inspection method

2011-03-29

2011-03-29

Chowdhury, Tarifur (Department: 2886)

Optics: measuring and testing

Inspection of flaws or impurities

Surface condition

C356S237400, C356S237500

Reexamination Certificate

active

07916288

ABSTRACT:
A method for inspecting a defect of a surface of a sample, includes irradiating a laser beam on the sample surface a plurality of times so that at least part of an illumination field of the laser beam on the sample surface illuminates a first area of the sample surface each of the plurality of times, detecting a plurality of scattered light rays from the first area caused by the plurality of times of irradiation, correcting errors of detection timings for the plurality of scattered light rays detected in the detection step, and determining a defect on the sample surface based on the plurality of scattered light rays in accordance with the correcting errors of detection timings.

REFERENCES:
patent: 6081325 (2000-06-01), Leslie et al.
patent: 7675613 (2010-03-01), Nakao et al.
patent: 2007/0182958 (2007-08-01), Manabe et al.
patent: 2008/0002194 (2008-01-01), Matsui
patent: 2008/0144024 (2008-06-01), Nakano
patent: 2008/0297783 (2008-12-01), Urano et al.
patent: 2008/0304055 (2008-12-01), Oshima et al.
patent: 2009/0279081 (2009-11-01), Urano et al.
patent: 09-304289 (1997-11-01), None
patent: 2000-162141 (2000-06-01), None

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