Defect inspection device for semiconductors

Details Defect inspection device for semiconductors Defect inspection device for semiconductors

1987-12-18

1990-05-08

Holtje, Nelson C.

Measuring, testing, or signalling instruments

Measuring, regulating or indicating instrument, or casing

Food preparation type

Patent

active

D03077241

REFERENCES:
patent: D292979 (1987-12-01), Chow
patent: 4745354 (1988-05-01), Fraser
patent: 4755746 (1988-07-01), Mallory et al.
Toshiba, "A Defect Inspection Device for Semiconductors", Dec. 5, 1961.

Affiliated with

Also associated with

Rating

Defect inspection device for semiconductors does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Defect inspection device for semiconductors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Defect inspection device for semiconductors will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2339401