Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2007-08-24
2011-12-13
Lyons, Michael A (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Reexamination Certificate
active
08077306
ABSTRACT:
A high speed defect inspection apparatus has a high-speed detector that includes a plurality of image sensors. The image sensors are arranged with gaps between them in the pixel direction to form two lines. The image sensors are arranged in a zigzag pattern so that they are not contiguous to each other in the scanning direction. The development cost is reduced by using an arrangement of a plurality of small-area image sensors. When an image sensor is installed, it is necessary to furnish a region required for installation. Since individual image sensors need to be arranged at fixed intervals, void regions result. A plurality of image sensors are arranged in a zigzag pattern to solve the void region problem.
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Hitachi High-Technologies Corporation
Lyons Michael A
Mattingly & Malur, P.C.
Valentin Juan D
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