Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2005-12-06
2005-12-06
Paladini, Albert W. (Department: 2125)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C700S097000, C700S110000, C700S107000
Reexamination Certificate
active
06973358
ABSTRACT:
At a stage before manufacture (product design stage or manufacturing process design stage), influence of defect occurrence in a component or process on other components and processes is estimated, and defect importance is evaluated to support the manufacturing process design. Failure rates of components are previously stored in a database. At a product design stage, an assembly fraction defective is calculated for an assembly process of each component of the product. Component arrangement relations are extracted from product design information. A component fraction defective is calculated based on the assembly fraction defective and the component failure rate. A numerical value indicating an influence degree of each assembly process is calculated by multiplying component fraction defectives by coefficients based on of the component arrangement relations and the component fraction defective, for relating components in each assembly process. Thereby, influence degrees of each component and process are evaluated.
REFERENCES:
patent: 5475695 (1995-12-01), Caywood et al.
patent: 5617321 (1997-04-01), Frizelle et al.
patent: 5649169 (1997-07-01), Berezin et al.
patent: 6088712 (2000-07-01), Huang et al.
patent: 6108586 (2000-08-01), Suzuki et al.
patent: 6230066 (2001-05-01), Sferro et al.
patent: 6233719 (2001-05-01), Hardikar et al.
patent: 6253115 (2001-06-01), Martin et al.
patent: 6256093 (2001-07-01), Ravid et al.
patent: 6341241 (2002-01-01), Mugibayashi et al.
patent: 6401000 (2002-06-01), Suzuki et al
patent: 6421122 (2002-07-01), Nara et al.
patent: 6526326 (2003-02-01), Suzuki et al
patent: 6553273 (2003-04-01), Suzuki et al
patent: 6625511 (2003-09-01), Suzuki et al.
patent: 10-334151 (1998-12-01), None
patent: 2001-100838 (2001-04-01), None
patent: 2001-121367 (2001-05-01), None
“Project Quality [of plant construction projects]” -Author Unknown. Project FKD—Viewed at: http://www1.neweb.ne.jp/wb/fukud/qualityeng.htm.
Nishi Takayuki
Suzuki Tatsuya
Wakuta Toru
Yamamoto Noriaki
Antonelli, Terry Stout and Kraus, LLP.
Masinick Michael D.
Paladini Albert W.
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