Defect detector and method of detecting defect

Details Defect detector and method of detecting defect Defect detector and method of detecting defect

2006-08-29

2006-08-29

Rosenberger, Richard A. (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

Surface condition

Reexamination Certificate

active

07099002

ABSTRACT:
A defect detector having: a first optical system including a first light source to irradiate a surface of a subject with coaxial incident-light while scanning, and a first imaging device to receive light regularly reflected from the subject and change the light to a first electrical signal to form a first electrical image; a second optical system including a second light source to irradiate the surface of the subject with inclined light while scanning, and a second imaging device to receive light scattered at the subject and change the light to a second electrical signal to form a second electrical image, in which the inclined light of the second light source does not meet the coaxial incident-light of the first light source; and a computer to compare the first electrical signal with a predetermined first threshold to detect a concavo-convex defect on the surface of the subject, and to compare the second electrical signal with a predetermined second threshold to detect a blocky color defect on the surface of the subject.

REFERENCES:
patent: 3792930 (1974-02-01), Obenreder
patent: 3975102 (1976-08-01), Rosenfeld et al.
patent: 4865445 (1989-09-01), Kuriyama et al.
patent: 5825499 (1998-10-01), Biedermann
patent: 5940175 (1999-08-01), Sun
patent: 6046803 (2000-04-01), Toh
patent: 6196127 (2001-03-01), Yamamoto et al.
patent: 7-55710 (1995-03-01), None
patent: 7-110305 (1995-04-01), None
patent: 07-128240 (1995-05-01), None
patent: 07-128241 (1995-05-01), None
patent: 09-325120 (1997-12-01), None
patent: 10-206335 (1998-08-01), None
patent: 2000-137004 (2000-05-01), None
patent: WO 96/39619 (1996-12-01), None
Patent Abstracts of Japan, JP 7-128240, May 19, 1995.
Patent Abstracts of Japan, JP 62-038348, Feb. 19, 1987.

Affiliated with

Also associated with

Rating

Defect detector and method of detecting defect does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Defect detector and method of detecting defect, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Defect detector and method of detecting defect will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3624046