Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2004-09-15
2008-10-21
Chawan, Sheela C (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S148000, C382S149000, C356S237200, C250S559450
Reexamination Certificate
active
07440606
ABSTRACT:
A control part of a defect detector is provided with a magnification operation part, an inspected image display part and a master image display part. The magnification operation part operates a display magnification α1(display magnification data) for a defective area on the basis of defective information. An imaging part images inspected image data so that an imaging magnification β1reaches the display magnification α1, and the inspected image display part displays the inspected image data on a detection monitor. The master image data display part operates a display magnification α2for master image data to be substantially identical to the display magnification α1, and displays the master image data on the detection monitor at the display magnification α2. Thus, the efficiency in a defect detecting operation of an operator is improved.
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Chawan Sheela C
Dainippon Screen Mfg. Co,. Ltd.
McDermott Will & Emery LLP
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