Defect detection using intermodulation signals

Details Defect detection using intermodulation signals Defect detection using intermodulation signals

1988-12-02

1989-09-19

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

324543, 324527, 324537, 379 26, G01R 3100, G01R 3108

Patent

active

048685062

ABSTRACT:
In order to test conductors on substrates for current constricting defects, such as cracks, narrow conductors, line breaks and intermittent opens, a test signal combining two alternating current signals at different frequencies and direct current offset signal is applied to the conductor. Upon encountering a defect, intermodulation signals are generated and detected. The phase of the detected signal and the phase of a reference signal are compared. The difference between the phase of the two signals is indicative of the presence of a defect in the conductor. The invention has particular application for testing thin conductors.

REFERENCES:
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patent: 3369176 (1968-02-01), Palatinus
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patent: 3711769 (1973-01-01), Peake
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patent: 4404514 (1983-09-01), Reichert, Jr.
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