Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
Patent
1979-11-01
1981-02-03
Nelms, David C.
Radiant energy
Photocells; circuits and apparatus
Optical or pre-photocell system
250572, G01N 2188
Patent
active
042490812
ABSTRACT:
The invention pertains to a defect detection system for inspecting fabric wherein fabric is scanned by electronic light-sensing apparatus for inconsistencies in light reflecting capability and defects produce electronic signals which are counted, and preferably, are automatically counted with respect to a predetermined time interval wherein fabric manufacturing apparatus may be automatically monitored to maintain a predetermined quality of product. Preferably, infrared frequencies are utilized for defect sensing purposes and electronic signal retention counting and timing apparatus automatically terminates fabric production if defect occurence exceeds a predetermined frequency in a given time interval.
REFERENCES:
patent: 3160759 (1964-12-01), Ward
patent: 3206606 (1965-09-01), Burgo et al.
patent: 3325649 (1967-06-01), Bird
patent: 3551678 (1970-12-01), Mitchell
patent: 3589816 (1971-06-01), Sugaya
patent: 3729635 (1973-04-01), Shottenfeld et al.
patent: 3736428 (1973-05-01), Monroe
patent: 3786265 (1974-01-01), Abilock et al.
patent: 3812373 (1974-05-01), Hosoe et al.
patent: 3850526 (1973-03-01), Corey
patent: 3859538 (1975-01-01), Mannonen
patent: 3994586 (1976-11-01), Sharkins et al.
patent: 4011457 (1977-03-01), Wolf
patent: 4057351 (1977-11-01), Fomenko
patent: 4075498 (1978-02-01), Takasuka et al.
patent: 4103177 (1978-07-01), Sanford et al.
patent: 4110048 (1978-08-01), Akutsu et al.
patent: 4134684 (1979-01-01), Jette
Cole Frederick A.
Deak Ronald L.
Nelms David C.
Sparton Corporation
LandOfFree
Defect detection system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Defect detection system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Defect detection system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-552271