Defect detection method

Details Defect detection method Defect detection method

1992-01-21

1993-09-14

Britton, Howard W.

Facsimile and static presentation processing

Facsimile

Specific signal processing circuitry

358101, H04N 718

Patent

active

052454240

ABSTRACT:
An image of a light irradiated object is picked up by a video camera. Detection of defects on the object is conducted from the image signal from the video camera. Two inspection zones adjacent each other are established on the picture screen, each having a preset size. The brightness of each of the respective two inspection zones is sensed and accumulated as the inspection zones are indexed across the screen. When the difference between the accumulated values of the respective inspection zones exceeds a preset threshold value a defect is defined.

REFERENCES:
patent: 3775556 (1973-11-01), Nagamatsu
patent: 4486777 (1984-12-01), Yamamura

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