Dynamic information storage or retrieval – Condition indicating – monitoring – or testing – Including radiation storage or retrieval
Patent
1991-06-26
1993-03-16
Psitos, Aristotelis
Dynamic information storage or retrieval
Condition indicating, monitoring, or testing
Including radiation storage or retrieval
369 4425, 369 4432, G11B 700, G11B 7095
Patent
active
051950766
ABSTRACT:
A defect detection circuit for optical pick up device having a record medium on which a track is formed which track has a plurality of segments formed in series along the track. The circuit comprises a first detection circuit for detecting a defect of a segment sampled to be detected by comparing difference between a latest data of a refresh signal from the segment and a preceding data of a refresh signal from a preceding segment sampled before the segment to be detected with a first predetermined value. The circuit further comprises a second detection circuit for detecting a defect of the segment to be detected by comparing the latest data with a second predetermined value and a discrimination circuit for discriminating whether the segment is defective or not.
REFERENCES:
patent: 4748609 (1988-05-01), Yonezawa et al.
patent: 4785442 (1988-11-01), Ohtake et al.
patent: 4847822 (1989-07-01), Takasugi et al.
patent: 4872152 (1989-10-01), Tsuyoshi et al.
patent: 4972398 (1990-11-01), Wachi
Psitos Aristotelis
Ricoh & Company, Ltd.
Tran Thang V.
LandOfFree
Defect detection circuit for optical pick up device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Defect detection circuit for optical pick up device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Defect detection circuit for optical pick up device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-356039