Defect detection apparatus, defect detection method and...

Details Defect detection apparatus, defect detection method and... Defect detection apparatus, defect detection method and...

2009-01-13

2011-12-27

Nguyen, Tu (Department: 2886)

Image analysis

Applications

Manufacturing or product inspection

Reexamination Certificate

active

08086023

ABSTRACT:
There are provided a defect detection apparatus, a defect detection method, and a computer program, which are capable of setting an appropriate reference line with respect to a plurality of edge points, to accurately detect a defect based upon a difference of each edge point, and in which a plurality of edge points are detected from an image including an edge of the object, a representative edge point representing the edge points present within a reference range having a prescribed width is calculated in each shifted position of the reference range while the reference range is sequentially shifted, residuals between a plurality of calculated representative edge points and corresponding edge points are calculated, a position and a size of the defect are specified based upon the calculated residuals, and the residuals are weighted and a representative edge point is repeatedly calculated, to obtain an apparent approximate curve (representative-edge-point sequence).

REFERENCES:
patent: 6222935 (2001-04-01), Okamoto
patent: 7365324 (2008-04-01), Noji et al.
patent: 2000-055827 (2000-02-01), None
patent: 2001-175865 (2001-06-01), None
patent: 2001-317927 (2001-11-01), None
patent: 2003-311464 (2003-11-01), None

Affiliated with

Also associated with

Rating

Defect detection apparatus, defect detection method and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Defect detection apparatus, defect detection method and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Defect detection apparatus, defect detection method and... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4316219