Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2009-01-13
2011-12-27
Punnoose, Roy M (Department: 2886)
Image analysis
Applications
Manufacturing or product inspection
Reexamination Certificate
active
08086024
ABSTRACT:
There is provided a defect detection apparatus capable of highly accurately detecting a defect of a size not larger than a size desired by the user, in which the size setting device sets the defect size, the reduction ratio setting device sets an image reduction ratio based on the set defect size, the image reduction device generates a reduced image obtained by reducing the original multi-valued image, the filter processing device performs filter processing on the reduced image for removing a defect in the reduced image, the image enlarging device generates an enlarged image obtained by enlarging the reduced image, subjected to the filter processing, at an image enlargement ratio corresponding to the reciprocal of the image reduction ratio, and the difference calculating device generates a difference image obtained by performing a calculation of a difference between the original multi-valued image and the enlarged image.
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Keyence Corporation
Kilyk & Bowersox P.L.L.C.
Punnoose Roy M
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