Defect counting method and apparatus

Details Defect counting method and apparatus Defect counting method and apparatus

1990-04-11

1991-09-10

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

382 25, G06K 946

Patent

active

050480936

ABSTRACT:
In a defect counting method and apparatus, a projection or a corner of a defect area is successively identified from a pixel and pixels close to the pixel, especially, from four pixel groups. The number of the defect areas is incremented when the projection is identified and decremented when the corner is identified.

REFERENCES:
patent: 4741044 (1988-04-01), Polomsky et al.
patent: 4758782 (1988-07-01), Kobayashi
patent: 4809341 (1989-02-01), Matsui et al.
patent: 4845558 (1989-07-01), Tsai et al.

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