Defect classification/inspection system

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

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Details

C382S227000, C382S305000

Reexamination Certificate

active

10222431

ABSTRACT:
An image of an inspection object is picked up by an image pickup unit, and a characteristics quantity of an image of a defect part extracted by a defect extracting unit is extracted and digitized by a characteristics extracting unit. A database preparing unit regroups defects having similar characteristics by a defect classification unit on the basis of the characteristics information digitized by the characteristics extracting unit with respect to defects belonging to a defect group selected and designated by an operator via a display/input unit, and prepares on a database memory a database in which the defects of the inspection object are hierarchically classified. A classification executing unit hierarchically classifies the defects of the inspection object with reference to the database provided by the database preparing unit on the basis of the digitized characteristics information extracted by the characteristics extracting unit from the image of the defect part of the inspection object extracted by the defect extracting unit. Thus, a defect classification/inspection system having high classification accuracy is provided.

REFERENCES:
patent: 4519041 (1985-05-01), Fant et al.
patent: 4748678 (1988-05-01), Takeda et al.
patent: 5226118 (1993-07-01), Baker et al.
patent: 5544256 (1996-08-01), Brecher et al.
patent: 6092059 (2000-07-01), Straforini et al.
patent: 6148099 (2000-11-01), Lee et al.
patent: 6292582 (2001-09-01), Lin et al.
patent: 6535776 (2003-03-01), Tobin et al.
patent: 6751343 (2004-06-01), Ferrell et al.
patent: 6847972 (2005-01-01), Vernau et al.
patent: 2003/0061243 (2003-03-01), Kim et al.
Kauppinen, H., Rautio, H. and Silven, O., “Non-Segmenting Defect Detection and SOM Based Classification for Surface Inspection Using Color Vision”, Conf. on Polorization and Color Techniques in Industrial Inspection, Jun. 1999, pp. 270-280.

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